The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2007

Filed:

Nov. 28, 2002
Applicants:

Petra Elisabeth DE Jongh, Eindhoven, NL;

Edwin Roks, Eindhoven, NL;

Robertus Adrianus Maria Wolters, Eindhoven, NL;

Hermanus Leonardus Peek, Eindhoven, NL;

Inventors:

Petra Elisabeth De Jongh, Eindhoven, NL;

Edwin Roks, Eindhoven, NL;

Robertus Adrianus Maria Wolters, Eindhoven, NL;

Hermanus Leonardus Peek, Eindhoven, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/11 (2006.01); H01L 27/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The semiconductor device () of the invention comprises a circuit that is covered by a passivation structure. It is provided with a first security element () that comprises a local area of the passivation structure and which has a first impedance. Preferably, a plurality of security elements () is present, whose the impedances differ. The semiconductor device () further comprises measuring means () for measuring an actual value of the first impedance, and a memory (7) comprising a first memory element (A) for storing the actual value as a first reference value in the first memory element (A). The semiconductor device () of the invention can be initialized by a method wherein the actual value is stored as the first reference value. Its authenticity can be checked by comparison of the actual value again measured and the first reference value.


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