The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Apr. 18, 2003
Peter J. Costa, Hudson, MA (US);
Stephen T. Sum, Hudson, MA (US);
Ross F. Flewelling, Oakland, CA (US);
Kevin T. Schomacker, Maynard, MA (US);
Jean-pierre Schott, Weston, MA (US);
Bret F. Draayer, Lincoln, MA (US);
Peter J. Costa, Hudson, MA (US);
Stephen T. Sum, Hudson, MA (US);
Ross F. Flewelling, Oakland, CA (US);
Kevin T. Schomacker, Maynard, MA (US);
Jean-Pierre Schott, Weston, MA (US);
Bret F. Draayer, Lincoln, MA (US);
Medispectra, Inc., Lexington, MA (US);
Abstract
The invention provides methods for determining the probability that a given region of a tissue sample contains tissue of a given category, such as CIN 1 (cervical intraepithelial neoplasia, grade 1), CIN 2/3 (cervical intraepithelial neoplasia grades 2 and/or 3), normal squamous, normal columnar, and metaplasia, for example. The invention provides increased diagnostic accuracy by combining a plurality of statistical classification techniques. Furthermore, in one embodiment, the invention comprises combining one or more statistical techniques with one or more non-statistical classification techniques.