The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2007

Filed:

Aug. 26, 2002
Applicants:

Yoshitada Oshida, Chigasaki, JP;

Satoshi Takahashi, Hitachinaka, JP;

Kenji Yasuda, Tokyo, JP;

Taisaku Seino, Hitachinaka, JP;

Inventors:

Yoshitada Oshida, Chigasaki, JP;

Satoshi Takahashi, Hitachinaka, JP;

Kenji Yasuda, Tokyo, JP;

Taisaku Seino, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12M 1/00 (2006.01); B32B 5/02 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus of stably obtaining fluorescent images of two or more fluorescent samples includes disposing the samples onto compartments defined on a substrate. The compartments are sequentially irradiated with an exciting light where the intensity varies. A value of fluorescence as generated from each of the samples is determined, and a fluorescent image is obtained based on the value of fluorescence.


Find Patent Forward Citations

Oshida, Yoshitada. (2007). Method in inspecting dna and apparatus therefor (U.S. Patent No. 7309568). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7309568

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…