The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Oct. 16, 2001
Applicants:
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Naoyuki Maeda, Osaka, JP;
Inventors:
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device for measuring eye characteristics, an operation device, and the coordinate origin and the coordinate axes of each eye are sufficiently related with one another. A measuring unit () measures eye optical characteristics based on a first light receiving signal from a first light receiving unit (), and measures a cornea topography based on a second light receiving signal from a second light receiving unit (). The measuring unit () also computes an ablation amount based on an aberration result.