The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Oct. 17, 2005
George W. Wood, Austin, TX (US);
Amol V. Bhinge, Austin, TX (US);
George W. Wood, Austin, TX (US);
Amol V. Bhinge, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method, computer program product, and data processing system for determining test sequences' coverage of events in testing a semiconductor design are disclosed. Test patterns are randomly generated by one or more 'frontend' computers. Results from applying these patterns to the design under test are transmitted to a 'backend' computer in the form of an ordered dictionary of events and bitmap and/or countmap data structures. A “bitmap” data structure encodes Boolean information regarding whether or not a given event was covered by a particular test sequence. A “countmap” data structure includes frequency information indicating how many times a given event was triggered by a particular test sequence. The backend computer combines results from each test sequence in a cumulative fashion to measure the overall coverage of the set of test sequences.