The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Jun. 29, 2004
Applicants:

John A. Nerl, Londonderry, NH (US);

Ken Pomaranski, Roseville, CA (US);

Gary Gostin, Plano, TX (US);

Andrew Walton, Rocklin, CA (US);

David Soper, Murphy, TX (US);

Inventors:

John A. Nerl, Londonderry, NH (US);

Ken Pomaranski, Roseville, CA (US);

Gary Gostin, Plano, TX (US);

Andrew Walton, Rocklin, CA (US);

David Soper, Murphy, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a computer readable medium comprises code for recording occurrences of data corruption in data retrieved from a memory subsystem, code for determining whether bit locations within the memory subsystem are associated with multiple occurrences of data corruption, code for deallocating, in response to the code for determining, memory regions containing bit locations associated with multiple occurrences of data corruption, code for analyzing patterns of data corruption repeated across multiple addresses of the memory subsystem, and code for controlling application of an error correction code (ECC) algorithm by the memory subsystem to erase bits associated with a repeated bit pattern, detected by the code for analyzing, from data retrieved from the memory subsystem.


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