The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Feb. 05, 2005
Ying-chih LU, Taipei, TW;
Chin-lung Wu, Taipei, TW;
Chun-yi Lee, Taipei, TW;
Chia-hsing Lee, Taipei, TW;
Chi-tsung Chang, Taipei, TW;
Ling-hung Yu, Taipei, TW;
Ying-Chih Lu, Taipei, TW;
Chin-Lung Wu, Taipei, TW;
Chun-Yi Lee, Taipei, TW;
Chia-Hsing Lee, Taipei, TW;
Chi-Tsung Chang, Taipei, TW;
Ling-Hung Yu, Taipei, TW;
Inventec Corporation, , TW;
Abstract
A computer platform automatic testing method and system is proposed, which is designed for use in conjunction with a computer platform for performing an automatic testing procedure on a computer-dedicated circuit unit installed on the computer platform, and which is characterized by the capability of performing an automatic testing procedure on a computer-dedicated circuit unit based on a user-specified set of hardware specification data about the computer platform and circuit unit under test, and the capability of automatically generating a test report that lists related data about each faulted part of the circuit unit being tested. This feature allows hardware engineers to more conveniently and efficiently correct faulted parts in the circuit unit being tested.