The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Feb. 02, 2004
Reza Safaee-rad, Etobicoke, CA;
Aleksander Crnatovic, Toronto, CA;
Jeffrey Hawthorne, San Francisco, CA (US);
Branko Bukal, Thornhill, CA;
Ray Leerentveld, Palgrave, CA;
Reza Safaee-Rad, Etobicoke, CA;
Aleksander Crnatovic, Toronto, CA;
Jeffrey Hawthorne, San Francisco, CA (US);
Branko Bukal, Thornhill, CA;
Ray Leerentveld, Palgrave, CA;
Photon Dynamics, Inc., San Jose, CA (US);
Abstract
A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R×S sensors; determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R×S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with R×S sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for R×S sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.