The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Sep. 30, 2003
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, Sun Mateo, CA (US);
Peter Corcoran, Galway, IR;
Petronel Bigioi, Galway, IR;
Adrian Zamfir, Bucuresti, RO;
Vasile Buzuloiu, Bucuresti, RO;
Danutz Ursu, Bucuresti, RO;
Marta Zamfir, Bucuresti, RO;
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, Sun Mateo, CA (US);
Peter Corcoran, Galway, IR;
Petronel Bigioi, Galway, IR;
Adrian Zamfir, Bucuresti, RO;
Vasile Buzuloiu, Bucuresti, RO;
Danutz Ursu, Bucuresti, RO;
Marta Zamfir, Bucuresti, RO;
FotoNation Vision Limited, Galway, IE;
Abstract
A method of automatically correcting dust artifact regions within images acquired by a system including a digital camera includes digitally-acquiring one or more original images with the digital camera. Probabilities that certain pixels correspond to dust artifact regions within the one or more digitally-acquired images are determined. The dust artifact regions are associated with one or more extracted parameters relating to the optical system when the one or more images were acquired. A statistical dust map is formed including mapped dust regions based on the dust artifact probability determining and associating operations. Pixels corresponding to dust artifact regions within the one or more original images are corrected based on the associated statistical dust map.