The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Apr. 02, 2001
Hyun-doo Shin, Seongnam, KR;
Yang-iim Choi, Suwon, KR;
Bangalore S. Manjunath, Santa Barbara, CA (US);
Peng Wu, Santa Barbara, CA (US);
Hyun-doo Shin, Seongnam, KR;
Yang-Iim Choi, Suwon, KR;
Bangalore S. Manjunath, Santa Barbara, CA (US);
Peng Wu, Santa Barbara, CA (US);
Samsung Electronics Co., Ltd., Suwon, KR;
The Regents of the University of California, Oakland, CA (US);
Applera Corporation, Norwalk, CT (US);
Abstract
A method of measuring a similarity between images is provided. The method includes the steps of (a) computing a statistical dissimilarity between the images; (b) computing a perceptual dissimilarity between the images; and (c) computing a dissimilarity between the texture features of the images based on the statistical dissimilarity and the perceptual dissimilarity. When images perceptually similar to a query image are searched and retrieved according to the above measuring method, the possibility that the retrieved images are not perceptually similar to the query image is small. Accordingly, the image searching performance can be improved when searching images having texture features similar to that of a query image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile