The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Apr. 23, 2003
Applicants:

Richard K. Fenrich, Blacksburg, VA (US);

Jennifer E. Robertson, Blacksburg, VA (US);

James David Rancourt, Blacksburg, VA (US);

Inventors:

Richard K. Fenrich, Blacksburg, VA (US);

Jennifer E. Robertson, Blacksburg, VA (US);

James David Rancourt, Blacksburg, VA (US);

Assignee:

Identification International, Inc., Blacksburg, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is provided that simultaneously or consecutively collects DNA samples and ridge and valley signatures from the same subject during the same collection window that adds value to forensic data collection processes. The collection of the DNA samples and ridge and valley signatures occur during the same collection window to assured the DNA sample and ridge and valley signatures identify the same individual.


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