The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Dec. 20, 2004
Applicants:

Richard R Bijjani, Westford, MA (US);

Richard F Eilbert, Lincoln, MA (US);

Shuanghe Shi, Southboro, MA (US);

Inventors:

Richard R Bijjani, Westford, MA (US);

Richard F Eilbert, Lincoln, MA (US);

Shuanghe Shi, Southboro, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information.


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