The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Mar. 27, 2007
Ke-chiang Huang, Taipei Hsien, TW;
Tzu-pai Wang, Taipei Hsien, TW;
Ke-Chiang Huang, Taipei Hsien, TW;
Tzu-Pai Wang, Taipei Hsien, TW;
Mediatek Inc., Hsin-Chu, TW;
Abstract
A read channel apparatus is disclosed for reading data recorded on an optical storage system at a predetermined baud rate. The apparatus asynchronously samples an analog read signal generating from the optical storage system and subtracts an estimated DC offset from the asynchronous sample values to generate a sequence of asynchronous DC-removed sample values. The asynchronous DC-removed sample values are separately interpolated by two interpolators to generate a sequence of synchronous even-time sample values and a sequence of synchronous odd-time sample values respectively. The synchronous even-time and odd-time sample values are separately equalized by two equalizers in accordance with a target spectrum to generate a sequence of even-time equalized sample values and a sequence of odd-time equalized sample values respectively. A DC offset estimator generates the estimated DC offset from the even-time equalized sample values and the odd-time equalized sample values. The interpolators are under the control of a timing recovery controller for synchronizing the even-time and odd-time sample values to the baud rate. In the preferred embodiment, the recorded data are determined from the even-time equalized sample values and the odd-time equalized sample values.