The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Dec. 17, 2004
Applicants:

Bernd Spruck, Mogglingen, DE;

Martin Edelmann, Aalen, DE;

Inventors:

Bernd Spruck, Mogglingen, DE;

Martin Edelmann, Aalen, DE;

Assignee:

Carl Zeiss AG, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

What is provided is an observation system, comprising a modulator which comprises a two-dimensional modulator region formed by a plurality of pixels; a control unit, which is connected to the modulator and by means of which the pixels are each independently switchable into first and second conditions; intermediate imaging optics which project an object to be viewed onto the two-dimensional modulator region, wherein, of the radiation incident on the pixels due to the projection by means of the intermediate imaging optics, only that radiation which impinges on the pixels being in the first condition passes into an optical observation path.


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