The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Sep. 03, 2002
Applicants:

Kazuhiko Kinoshita, Aichi, JP;

Megumu Shio, Kanagawa, JP;

Inventors:

Kazuhiko Kinoshita, Aichi, JP;

Megumu Shio, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides a highly stable optical microscope that prevents drift and makes it possible to record images or take measurements for several hours with accuracy in the order of nanometers. The highly stable optical microscope of this invention includes the support structure () that accommodates and supports components including the optical imaging system, straight tube () that accommodates and supports components including the optical photometric system, and support structure () that accommodates and supports components including the illumination system. These support structures have a hollow pyramid or conical shape with a low center of gravity. The highly stable optical microscope of this invention features the objective lenses, imaging lenses, optical imaging and photometric systems that are mounted, forming a straight line, on the supporting structures that are symmetrical about the optical axis in both shape and mass.


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