The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Dec. 24, 2003
Applicant:
Jerome Hazart, Grenoble, FR;
Inventor:
Jerome Hazart, Grenoble, FR;
Assignee:
Commissariat a l'Energie Atomique, Paris, FR;
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of optical characterization of a layer of material in which the spectrum of index n* (λ) is characterized by a limited number of 'nodes' that are points with coordinates (λ, n, k) or (λ, n*), with n=n(λ), k=k(λ) and n*=n+jk, where j, and an interpolation law between the 'nodes,' which can be, for example, linear, cubic, of “spline” type or polynomial (of any given degree). This interpolation law allows the calculation, from the “nodes,” of the refraction indexes and the extinction coefficients for the wavelengths located between the “nodes.”