The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Dec. 17, 2004
David A. Leep, Des Moines, WA (US);
David C. Soreide, Seattle, WA (US);
John A. Bell, Issaquah, WA (US);
Ronald L. Hagman, Pinehurst, ID (US);
David A. Leep, Des Moines, WA (US);
David C. Soreide, Seattle, WA (US);
John A. Bell, Issaquah, WA (US);
Ronald L. Hagman, Pinehurst, ID (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems, methods, and computer program products are provided for accurately measuring frequency-and/or-phase-related parameters of a sinusoidal signal that varies non-linearly in frequency or phase. A sinusoidal signal is sampled over a finite period of time at a plurality of sample points. The sampled signals are pre-processed, and a Fourier transform is performed on the pre-processed sampled signals. Phases of the pre-processed sampled signals are extracted from the Fourier transform, and a measurement indicative of frequency of the sinusoidal signal is determined from slope of the phases of the pre-processed sampled signals. Range to a target may be determined using the exemplary signal processing described above on laser radar interference signals.