The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Dec. 01, 2004
Kentaro Tezuka, Musashino, JP;
Tsuyoshi Yakihara, Musashino, JP;
Sadaharu Oka, Musashino, JP;
Shinji Kobayashi, Musashino, JP;
Akira Miura, Musashino, JP;
Kentaro Tezuka, Musashino, JP;
Tsuyoshi Yakihara, Musashino, JP;
Sadaharu Oka, Musashino, JP;
Shinji Kobayashi, Musashino, JP;
Akira Miura, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
An optical sampling apparatus has an electron beam generating apparatus which generates an electron beam by irradiating a cathode with an optical signal, a deflection electrode which deflects the generated electron beam, a sampling slit which transmits a part of the deflected electron beam, and a charge detection section which detects the quantity of charges or accumulated current of the transmitted electron beam. It is possible to perform accurate sampling in a high band.