The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Dec. 16, 2003
Applicants:

Joseph F. Bringley, Rochester, NY (US);

Yannick J. F. Lerat, Chalon-sur-Saone, FR;

Nancy B. Liebert, Rochester, NY (US);

Richard W. Wien, Pittsford, NY (US);

David L. Patton, Webster, NY (US);

Inventors:

Joseph F. Bringley, Rochester, NY (US);

Yannick J. F. Lerat, Chalon-sur-Saone, FR;

Nancy B. Liebert, Rochester, NY (US);

Richard W. Wien, Pittsford, NY (US);

David L. Patton, Webster, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C01B 25/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to an antimicrobial composition comprising an antimicrobial compound and a polyethylene-polyvinylalcohol copolymer. It further relates to a medium having antimicrobial properties comprising a support and a layer comprising an antimicrobial composition comprising an antimicrobial compound and a polyethylene-polyvinylalcohol copolymer.


Find Patent Forward Citations

Loading…