The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
Oct. 27, 2006
Yoshihiro Seto, Minamiashigara, JP;
Nobuaki Tokiwa, Minamiashigara, JP;
Yoichi Endo, Minamiashigara, JP;
Yoshihiro Seto, Minamiashigara, JP;
Nobuaki Tokiwa, Minamiashigara, JP;
Yoichi Endo, Minamiashigara, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Samples and dry chemical analysis elements, which are necessary for analyses of the samples, are loaded on a sample tray. Each sample is sucked with a spotting nozzle of a spotting unit and spotted onto one dry chemical analysis element. Analysis information, which contains information representing a type of analysis, is appended to each dry chemical analysis element. The analysis information is read with a reading device located such that, when a certain sample is located at a position for sample suction by an operation of the sample tray, the reading device reads the analysis information, which has been appended to a next dry chemical analysis element to be used for the analysis of the certain sample, at a position at which the next dry chemical analysis element is located.