The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Mar. 29, 2006
Applicant:

Shuichi Kawana, Kyoto, JP;

Inventor:

Shuichi Kawana, Kyoto, JP;

Assignee:

Shimadzu Corporation, Kyoto-Shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/02 (2006.01); G01N 30/90 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of gas chromatograph mass spectrometry with a negative chemical ionization (NCI) process includes analyzing a standard substance for the NCI by deriving with a derivatization reagent a fatty acid with a multiple number of carbon atoms, measuring the standard substance for the NCI by negative chemical ionization, and obtaining a retention time for each of the number of carbon atoms. The method includes measuring, under a same condition, a standard sample of each of from one to a plurality of measurement object components by negative chemical ionization, and obtaining a respective retention time for each of the measurement object components, and obtaining a retention index for the NCI of each measurement object component using the respective retention time of the measurement object component, and the retention time of the standard substance. The index facilitates both correcting the retention time of each measurement object component, and identifying substances.


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