The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

Aug. 16, 2004
Applicants:

Richard E. Wahler, St. James, NY (US);

Kevin Harney, Brooklyn, NY (US);

Inventors:

Richard E. Wahler, St. James, NY (US);

Kevin Harney, Brooklyn, NY (US);

Assignee:

Standard Microsystems Corporation, Hauppauge, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a monitoring device (e.g., a slave device) may be configured to perform a plurality of monitoring functions. For example, the monitoring device may comprise a watchdog timer configured to monitor communications between the processing unit (e.g., a host processor) and the monitoring device. The watchdog timer may cause the monitoring device to enter a failsafe mode of operation if the processing unit fails to communicate with the monitoring device within a predetermined period of time. Additionally, the monitoring device may be configured to perform thermal management functions via one or more temperature sensors. The monitoring device may enter the failsafe mode of operation if a sensed temperature exceeds a predetermined temperature limit. Furthermore, the monitoring device may also comprise a status unit that is operable to provide the processing unit an indication of a state of the monitoring device.


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