The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Jan. 14, 2004
Douglas Lee, Cupertino, CA (US);
Fanyun (Michelle) Kong, San Jose, CA (US);
Marc Spitzer, San Jose, CA (US);
John Packer, San Jose, CA (US);
Douglas Lee, Cupertino, CA (US);
Fanyun (Michelle) Kong, San Jose, CA (US);
Marc Spitzer, San Jose, CA (US);
John Packer, San Jose, CA (US);
Adaptec, Inc., Milpitas, CA (US);
Abstract
A system and method for testing a development device includes extracting multiple parameters of the development device from a product specification for the development device. The parameters being arranged in a predetermined first order. The parameters are stored in a testing data file. The testing data file can be input into a test bench system being coupled to the development device. The test bench system can test the development device.