The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Jan. 12, 2006
Tim J. Kostyk, Louisville, KY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Jeff R. Layton, New York, NY (US);
Peter K. Malkin, Ardsley, NY (US);
Stephen G. Perun, Evans, GA (US);
Kenneth L. Pyra, Cave Creek, AZ (US);
Padmanabhan Santhanam, Yorktown Heights, NY (US);
John C. Thomas, Yorktown Heights, NY (US);
Scott W. Weller, Penfield, NY (US);
Tim J. Kostyk, Louisville, KY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Jeff R. Layton, New York, NY (US);
Peter K. Malkin, Ardsley, NY (US);
Stephen G. Perun, Evans, GA (US);
Kenneth L. Pyra, Cave Creek, AZ (US);
Padmanabhan Santhanam, Yorktown Heights, NY (US);
John C. Thomas, Yorktown Heights, NY (US);
Scott W. Weller, Penfield, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method of optimizing at least one production or testing processes in a mass manufacturing industry, includes steps of: collecting error data relating to a product at a plurality of points along its production and distribution chain; classifying the error data into categories of errors to provide classified error data; analyzing relationships among the classified error data; and suggesting modifications to at least one of the production or testing processes based on the analysis.