The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

Dec. 20, 2005
Applicants:

Toru Fujii, Kyoto, JP;

Shiro Sugihara, Kyoto, JP;

Inventors:

Toru Fujii, Kyoto, JP;

Shiro Sugihara, Kyoto, JP;

Assignee:

Omron Corporation, Kyoto-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A quality variation display device that can surely identify periodic information about quality on a product number basis such as the occurrence of a failure for every prescribed number of products is provided. The device includes a quality data storing database that stores the measurement result of each product measured by a measuring unit in association with the manufacturing order, an interval statistic calculation portion that shifts an interval corresponding to a prescribed number of products by a prescribed shift number of products, obtains a statistic for each of the intervals, and produces a graph representing the statistics in the manufacturing order at equal intervals, and a display portion that displays the graph.


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