The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

May. 23, 2003
Applicants:

Arthur V. Forman, Orlando, FL (US);

Anthony Krivanek, Orlando, FL (US);

Dat T. Nguyen, Orlando, FL (US);

Scott P. Lapointe, Orlando, FL (US);

Michael J. Mayercik, Tucson, AZ (US);

Inventors:

Arthur V. Forman, Orlando, FL (US);

Anthony Krivanek, Orlando, FL (US);

Dat T. Nguyen, Orlando, FL (US);

Scott P. LaPointe, Orlando, FL (US);

Michael J. Mayercik, Tucson, AZ (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); H04N 5/225 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Objects are detected in an image using a spatially variant filter. The size of the filter is adjusted based on the portion of the image being processed by the filter. Portions of the image which are closer to an imaging device which captured the image are processed using a larger sized filter. Portions of the image which are further from the imaging device are processed using a smaller sized filter.


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