The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

Dec. 21, 2005
Applicants:

Klaus Hambüchen, Hemhofen, DE;

Klaus Klingenbeck-regn, Nürnberg, DE;

Inventors:

Klaus Hambüchen, Hemhofen, DE;

Klaus Klingenbeck-Regn, Nürnberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray system has two X-ray arrays each having an X-ray source and an X-ray detector. The X-ray arrays can be swiveled around a common swiveling axis within whose range an object is locatable. The X-ray detectors are situated opposite the X-ray sources with respect to the swiveling axis. They are embodied as flat-panel detectors so that an irradiating of the object in a first or, as the case may be, second irradiation plane can be registered by them. The irradiation planes contain the swiveling axis and run perpendicular to connecting lines linking the X-ray sources to the X-ray detectors. The area contents of the irradiation planes are mutually different. When the X-ray arrays are positioned correspondingly, the first irradiation plane will completely cover the second irradiation plane.


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