The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

Jul. 10, 2002
Applicants:

Derek J. Nelson, San Diego, CA (US);

Paul R. Hartmann, Escondido, CA (US);

Edward S. Tyburski, Carlsbad, CA (US);

Inventors:

Derek J. Nelson, San Diego, CA (US);

Paul R. Hartmann, Escondido, CA (US);

Edward S. Tyburski, Carlsbad, CA (US);

Assignee:

Acterna LLC, Germantown, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for automated sectionalization of a DS1/DS3 data path based upon information received at a single location along the path. A test and monitor device is located at a point of demarcation between an LEC and an IEC. A Remote Module is located at a point of demarcation between the LEC and CPE. The test and monitor device is fully ANSI compatible. The information that is received is processed in a three step process in order to generate a 'Sectionalizer Report'. In preparing the Sectionalizer Report, the information output from a filter is used to determine where particular Events originated.


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