The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Aug. 30, 2004
Lam T. Ngo, Raleigh, NC (US);
Erick T. Swanson, Cary, NC (US);
Peter J. Marsico, Chapel Hill, NC (US);
Lam T. Ngo, Raleigh, NC (US);
Erick T. Swanson, Cary, NC (US);
Peter J. Marsico, Chapel Hill, NC (US);
Tekelec, Morrisville, NC (US);
Abstract
Method and systems for simultaneously performing link fault sectionalization (LFS) tests for multiple time division multiplexed (TDM) channels are disclosed. An LFS test state machine may simultaneously process test data for multiple TDM channels by receiving test data associated with the TDM channels, accessing stored LFS state information associated with the TDM channels from an LFS state storage element, sequentially processing the test data for the channels, generating new LFS state information for each channel, and storing the new LFS state information in the LFS state storage element.