The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

Dec. 20, 2004
Applicants:

Ichiro Kataoka, Chiyoda, JP;

Masayuki Hariya, Chiyoda, JP;

Makoto Onodera, Tsuchiura, JP;

Yoshimitsu Hiro, Yokohama, JP;

Inventors:

Ichiro Kataoka, Chiyoda, JP;

Masayuki Hariya, Chiyoda, JP;

Makoto Onodera, Tsuchiura, JP;

Yoshimitsu Hiro, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analysis model producing/assisting apparatus produces a recognition model, approximating surfaces of configuration and ridgelines thereof by planes and lines, from a configuration model showing the configuration. Thereafter, it produces a mapping model through dividing the recognition model into cubic grids, and then produces an analysis model, through mapping grid points of the mapping model onto the configuration model. When producing the recognition model, know-how for producing the analysis model, which gives an influence upon quality of the meshes of the analysis model, is take out from a database, and that know-how for producing the analysis model is applied onto the configuration model.


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