The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Dec. 04, 2003
Robert L. Kay, Fort Worth, TX (US);
Carl Brock Brandenberg, Fort Worth, TX (US);
Robert L. Kay, Fort Worth, TX (US);
Carl Brock Brandenberg, Fort Worth, TX (US);
Other;
Abstract
A method for measuring and characterizing the nonlinearities of a display device by adaptive bisection using human perception for measurement. This method makes no assumptions about a display device's characteristics and can characterize any type of display device with any arbitrarily complex monotonic display transfer function. Unlike other display measurement solutions, this process is completely software based and has no hardware measurement device requirements that would raise costs and limit portability. As a result, this process can be distributed and applied commercially at a very low cost.