The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Nov. 29, 2005
Raymond Doak Rempt, Woodinville, WA (US);
Raymond Doak Rempt, Woodinville, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
There is provided an inspection device for the detection of flaws in a component. The inspection device comprises a magnetic field generator, a first array of magnetoresistive sensors and a second array of magnetoresistive sensors, in which the second array is substantially orthogonal to the first array. The signals generated by the first and second arrays are utilized by a processing element to determine a curl of the magnetic field signals effected by the eddy currents including the eddy currents encountering a flaw in the component. The curl of the magnetic field signals is then used to better illustrate the existence of the flaw and various parameters of the flaw. The magnetic field generator comprises a coil or linear arrays of conductors. The inspection device is preferably contained (1) within a hand-held housing or (2) mounted on any automated inspection platform, and advantageously comprises a display for illustration of the detected flaw.