The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Apr. 13, 2006
Yoshinori Iketaki, Tokyo, JP;
Masaaki Fujii, Yokohama, JP;
Takeshi Watanabe, Yamato, JP;
Takashige Omatsu, Yokohama, JP;
Kimihisa Yamamoto, Tokyo, JP;
Toshio Suzuki, Chiba, JP;
Yoshinori Iketaki, Tokyo, JP;
Masaaki Fujii, Yokohama, JP;
Takeshi Watanabe, Yamato, JP;
Takashige Omatsu, Yokohama, JP;
Kimihisa Yamamoto, Tokyo, JP;
Toshio Suzuki, Chiba, JP;
Japan Science & Technology Agency, Kawaguchi-shi, JP;
Olympus Corporation, Tokyo, JP;
Nippon Roper Co., Ltd., Tokyo, JP;
Abstract
A three-dimensional analyzing device includes a first beam source for generating a first beam, a second beam source for generating a second beam, an optical system for spatially overlapping the first and second beams at least partly and irradiating the beams onto a specimen to three-dimensionally confine a photoactive region in a specimen, and a photo acceptance element for accepting a response light emitted from the photoactive region. Preferably, the device further includes an operation unit for calculating a correlation function of a response light in the time domain based on the output of the photo acceptance element to analyze a desired physical value of the specimen.