The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

Jun. 01, 2003
Applicants:

Elisha Moses, Rehovot, IL;

Stephan Yves Thiberge, La Celle St. Cloud, FR;

Inventors:

Elisha Moses, Rehovot, IL;

Stephan Yves Thiberge, La Celle St. Cloud, FR;

Assignee:

Quantomix Ltd., Nes-Ziona, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A specimen enclosure assembly () for use in an electron microscope and including a rigid specimen enclosure dish () having an aperture () and defining an enclosed specimen placement volume (), an electron beam permeable, fluid impermeable, cover () sealing the specimen placement volume () at the aperture () from a volume outside the enclosure and a pressure controller communicating with the enclosed specimen placement volume () and being operative to maintain the enclosed specimen placement volume () at a pressure, which exceeds a vapor pressure of a liquid sample () in the specimen placement volume () and is greater than a pressure of a volume outside the enclosure, whereby a pressure differential across the cover () does not exceed a threshold level at which rupture of the cover () would occur.


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