The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2007

Filed:

May. 18, 2005
Applicants:

Seisaku Iwasa, Ritto, JP;

Yuji Yokota, Ritto, JP;

Yuichiro Minakuchi, Ritto, JP;

Inventors:

Seisaku Iwasa, Ritto, JP;

Yuji Yokota, Ritto, JP;

Yuichiro Minakuchi, Ritto, JP;

Assignee:

Ishida Co., Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65B 1/30 (2006.01); B65B 57/02 (2006.01); B07C 5/10 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A bag packaging system includes a bag packager and a defect detection device that receives bags manufactured by the bag packager and conveys the bags while checking for defects. The defect detection device includes a first conveyor belt that is arranged below the bag packager, a line sensor that is arranged adjacent to a downstream end of the first conveyor belt, and a controller. The line sensor sends a detection signal when it detects an object that is conveyed by the first conveyor belt. The controller stores the size of a proper bag that is being manufactured. The controller finds a defective bag based on the size of the proper bag, the conveying speed of the first conveyor belt, and duration of the detection signal from the line sensor. The defect detection device can detect defects in bags promptly after the bags are manufactured by the bag packaging machine.


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