The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2007

Filed:

Apr. 14, 2004
Applicants:

Patrick Dooling Bossman, Alexandria, VA (US);

You-chin Fuh, San Jose, CA (US);

Shuanglin Guo, San Jose, CA (US);

Chan-hua Liu, San Jose, CA (US);

Yoichi Tsuji, San Jose, CA (US);

Inventors:

Patrick Dooling Bossman, Alexandria, VA (US);

You-Chin Fuh, San Jose, CA (US);

Shuanglin Guo, San Jose, CA (US);

Chan-Hua Liu, San Jose, CA (US);

Yoichi Tsuji, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

In various embodiments, a method, apparatus, and article of manufacture collect statistics in a database management system. A workload comprising a plurality of database queries is received. Query statistics for the database queries are identified. The query statistics for the database queries are consolidated to provide consolidated statistics. One or more statistics collection requests are generated based on the consolidated statistics.


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