The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Mar. 28, 2006
James Zhuge, Palo Alto, CA (US);
James Zhuge, Palo Alto, CA (US);
Crystal Instruments Corporation, Sunnyvale, CA (US);
Abstract
The present invention utilizes multiple A/D (analog-to-digital) paths and cross-path calibration to provide accurate and reliable measurements for each input channel in a data acquisition system. When the system and method are applied, user and automated methods of selecting among a number of alternative input range settings can be reduced, or even eliminated. That is, there is a significant reduction or complete elimination of input range settings in a measurement system. For each measurement channel of interest, the input signal is directed to at least two paths, e.g., Path A and Path B. The first path measures the full range (e.g., +/−10 volts), while the second path includes a high-gain amplifier. Each path includes an analog-to-digital converter (ADC), so that there is a one-to-one correspondence between the number of paths and the number of ADCs, which sample the input signal simultaneously.