The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2007

Filed:

Mar. 03, 2004
Applicants:

Yi-lin Lai, Taipei, TW;

Yi-chung Chan, Taipei, TW;

Inventors:

Yi-Lin Lai, Taipei, TW;

Yi-Chung Chan, Taipei, TW;

Assignee:

Via Technologies, Inc, Taipei, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The device includes a servo control unit, a data path control unit, a defect detection unit, and a logic combination unit. The data path control unit further includes a preamplifier receiving data from a lens and generating RF signals for data process. The defect detection unit receives the various signals for detecting different kinds of defects to set corresponding defect flag signals. The defect detection unit includes means for ADefectdetection, means for EFMDefect detection, means for RPDefect detection, means for Interruption detection, means for ADefect detection, and means for DSPDefect detection.


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