The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2007

Filed:

Nov. 03, 2005
Applicants:

Stephen T. Trinh, San Jose, CA (US);

Dixie H. Nguyen, San Jose, CA (US);

Inventors:

Stephen T. Trinh, San Jose, CA (US);

Dixie H. Nguyen, San Jose, CA (US);

Assignee:

Atmel Corporation, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory system incorporating redundancy utilizes a content addressable memory to monitor addresses during memory accesses. The content addressable memory provides a pointer to an alternate memory location when a previously determined faulty location is requested. Redundant memory cells are accessed by use of column redundancy information output from the content addressable memory. During a memory access cycle a register in the content addressable memory latches a memory address. The content addressable memory decodes the address and produces column redundancy information as an output. The column redundancy information is latched during a period complementary to the memory access cycle. By utilizing complementary memory access phases to latch memory addresses in contrast with a utilization of column redundancy information, a single set of registers may be used. Additionally, concurrent read and write operations are supported.


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