The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Dec. 06, 2004
Shinichi Kohno, Saitama, JP;
Shinichi Kohno, Saitama, JP;
Fujinon Corporation, Saitama, JP;
Abstract
Specularly reflected light from a convergence position on an object surfaceenters a second critical-angle prism, another prism, and a first critical-angle prismof a parallel beam selection optical systemin this order as a parallel beam traveling along the optical axis. The critical-angle prismshave critical angles of 45 degrees with respect to the wavelength of the light beam. Light beams other than the parallel light beam are removed at oblique surfacesa,a of the critical-angle prisms, thereby allowing only the parallel light beam to exit as a regular light beam. This parallel beam is formed into a convergent light by a collimator lens, reflected by a half prismand converged on an image pickup surface of an image pickup device. In this way, unnecessary noise light can be removed without placing a pin hole plate such as that placed before the image pickup plane in a confocal microscope.