The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Apr. 04, 2006
Applicants:
James L. Overbeck, Ada, MI (US);
Thomas Richardson, Ada, MI (US);
Inventors:
James L. Overbeck, Ada, MI (US);
Thomas Richardson, Ada, MI (US);
Assignee:
X-Rite, Inc., Grand Rapids, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for monitoring a process output with a highly abridged spectrophotometer. The method includes securing spectral data for each spectral primary used in a process, measuring spectral data with a highly abridged spectrophotometer for a sample produced by the process, determining an estimated weight for each spectral primary in the sample, and computing spectral data representative of the sample based on the secured spectral data and the determined estimated weight for each spectral primary in the sample.