The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Jul. 18, 2005
Atsuhiro Tsuchiya, Hachioji, JP;
Yoshihiro Kawano, Hachioji, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Tadashi Hirata, Hachioji, JP;
Atsuhiro Tsuchiya, Hachioji, JP;
Yoshihiro Kawano, Hachioji, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Tadashi Hirata, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The invention reduces the loss of fluorescence intensity obtained from a specimen to acquire clear fluorescence images when irradiating the specimen with ultrashort-pulse laser light produced by a laser light source. The invention provides a laser-scanning examination apparatus including a laser light source for producing ultrashort-pulse laser light; a laser light source for producing continuous-wave laser light; a measurement head including an optical scanning unit for scanning the laser light on a specimen and an objective optical system; an imaging unit for detecting return light from the specimen in response to the ultrashort-pulse laser light; and an imaging unit for detecting return light from the specimen in response to the continuous-wave laser light. The laser light sources and one imaging unit are connected to the measurement head by an optical fiber, and the other imaging unit is connected to the measurement head by another optical fiber with a larger core diameter.