The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Jan. 19, 2006
Applicants:
David Brady, Durham, NC (US);
Scott T. Mccain, Durham, NC (US);
Michael E. Gehm, Durham, NC (US);
Michael E. Sullivan, Raleigh, NC (US);
Prasant Potuluri, Durham, NC (US);
Inventors:
David Brady, Durham, NC (US);
Scott T. McCain, Durham, NC (US);
Michael E. Gehm, Durham, NC (US);
Michael E. Sullivan, Raleigh, NC (US);
Prasant Potuluri, Durham, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/04 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A class of aperture coded spectrometer is optimized for the spectral characterization of diffuse sources. The instrument achieves high throughput and high spatial resolution by replacing the slit of conventional dispersive spectrometers with a spatial filter or mask. A number of masks can be used including Harmonic masks, Legendre masks, and Hadamard masks.