The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2007

Filed:

May. 26, 2004
Applicants:

Takayuki Noma, Tokyo, JP;

Tadayuki Ito, Tokyo, JP;

Hitoshi Otani, Tokyo, JP;

Mitsuharu Yamada, Tokyo, JP;

Nobuo Kochi, Tokyo, JP;

Inventors:

Takayuki Noma, Tokyo, JP;

Tadayuki Ito, Tokyo, JP;

Hitoshi Otani, Tokyo, JP;

Mitsuharu Yamada, Tokyo, JP;

Nobuo Kochi, Tokyo, JP;

Assignee:

Topcon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A three-dimensional field for calibration having a wide-angle areaand a zooming arealocated within an area overlapped with the wide-angle areacomprises: a plurality of rough alignment reference marksfor zooming and a plurality of precise alignment reference marksfor zooming, and the rough alignment reference marksand the precise alignment reference marksfor zooming being arranged within the zooming area; and a plurality of rough alignment reference marksfor wide-angle and a plurality of precise alignment reference marksfor wide-angle, the rough alignment reference marksand the precise alignment referencemarks for wide-angle being arranged within the wide-angle area


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