The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7301336 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 27, 2007

Filed:

Jul. 06, 2005
Applicants:

Yasuhiro Endo, Kawasaki, JP;

Shinichi Wakana, Kawasaki, JP;

Inventors:

Yasuhiro Endo, Kawasaki, JP;

Shinichi Wakana, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The magnetic field generator device comprises a plurality of magnetic field generator units, which generate distinct magnetic fields in different locations, and at least two or more of these magnetic field generator units have different external shape, configuration or size. The magnetic field formed by such a magnetic field generator device is scanned by the probe device of a magnetic force microscope, and based on the measurement result, the probe device is calibrated.


Find Patent Forward Citations

Endo, Yasuhiro. (2007). Magnetic field generator device for calibration of magnetic force microscope (U.S. Patent No. 7301336). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7301336

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…