The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Oct. 24, 2005
Qingying HU, Clifton Park, NY (US);
Kevin George Harding, Nishkayuna, NY (US);
Joseph Benjamin Ross, Cincinnati, OH (US);
Xiaoping Qian, Clifton Park, NY (US);
Qingying Hu, Clifton Park, NY (US);
Kevin George Harding, Nishkayuna, NY (US);
Joseph Benjamin Ross, Cincinnati, OH (US);
Xiaoping Qian, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.