The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2007

Filed:

Mar. 31, 2005
Applicants:

Dinesh Mysore Siddu, Bangalore, IN;

Sandeep Kumar Dewangan, Bangalore, IN;

Gopichand Katragadda, Bangalore, IN;

Sivaramanivas Ramaswamy, Bangalore, IN;

Inventors:

Dinesh Mysore Siddu, Bangalore, IN;

Sandeep Kumar Dewangan, Bangalore, IN;

Gopichand Katragadda, Bangalore, IN;

Sivaramanivas Ramaswamy, Bangalore, IN;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/11 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for estimating a depth of a crack from ultrasound scan data are provided. The method includes mapping multiple amplitude responses from the ultrasound scan data, each mapped amplitude response being representative of a signal from one of the sensors. The method further includes locating multiple linear responses among the mapped amplitude responses, each linear response being an indicator of a reflected signal from the crack. One or more sensor that corresponds to the linear responses from a given crack is identified. The depth of the crack is estimated using data from the identified sensors.


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