The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Nov. 14, 2002
Harm Sluiman, Scarborough, CA;
Marcelo Paternostro, Markham, CA;
Harm Sluiman, Scarborough, CA;
Marcelo Paternostro, Markham, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the invention include a testing measurement which output a non-binary test result for one or more steps or processes performed during execution of a test of a subject. The non-binary test result, which may be output by a verification point or a test script, provides a developer with an improved gauge of the subject under test. In embodiments of the present invention, a test script or verification point will, rather than simply generate a 'pass' or 'fail' (i.e., “successful” or “unsuccessful”) output, generate a non-boolean value providing data with improved correlation between the test output and the relative success of a test script. In some embodiments, each verification point or test script can be associated with a rule for determining the test output which can be easily modified. This aspect provides users with an ability to carefully develop and implement a test result rule which provides output which enhances test output data analysis.