The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2007

Filed:

Jan. 29, 2004
Applicants:

Haruo Nishida, Sapporo, JP;

Takuya Ishida, Sapporo, JP;

Inventors:

Haruo Nishida, Sapporo, JP;

Takuya Ishida, Sapporo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test circuit comprises a selector SELhaving a first input to which signals MOUT from a macro block MBare input and a second input to which test input signals TINand TINfor a macro block MBare input, and a selector SELhaving a first input to which a signal SQ from the SELis input and a second input to which a signal MOUT from the MBis input. In a first test mode in which the MBis tested, the SELoutputs the signals MOUT from the MBto a first input of the SEL, and the SELoutputs the signal SQ from the SELto the MB. In a second test mode in which the MBis tested, the SELoutputs the test input signals TINand TINfor the MBto the MB, and the SELoutputs the signals MOUT from the MBas a test output signal TOUT for the MB


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