The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Jun. 15, 2004
Test data compression and decompression method using zero-detected run-length code in system-on-chip
Applicants:
Sung-ho Kang, Seoul, KR;
Yong Lee, Seoul, KR;
Inventors:
Sung-Ho Kang, Seoul, KR;
Yong Lee, Seoul, KR;
Assignee:
Industry-Academic Cooperation Foundation, Yonsei University, Seodaemoon-Gu, Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of effectively compressing a test vector is introduced for testing a system-on-chip (SOC) semiconductor device. Since the number of test vectors is increased in a SOC, the number of '0's is increased if adjacent test vectors are properly aligned using an ordering algorithm. '0000' is considered as a single block and a counter of ‘0-group’ is incremented by one to encode each further instance of the string ‘0000’. A codeword capable of being decompressed can be generated using only a counter without using a memory block.